Employees of Q-Tech Roding work in front of the ZEISS METROTOM 1500 computer tomograph

Technologies

CT
KMS
3D scan
"Our measurement experts support your quality assurance and detect defects before they occur."

To the point

Defect analysis can be used to determine the effects of long-term stress on components or tools. Our state-of-the-art testing and measuring technology enables the non-destructive detection of changes in shape, weak points, functional restrictions and damage, even on the inside.

The results are displayed and evaluated with pinpoint accuracy using high-resolution 3D or 2D imaging. In addition, irregularities can be visualized as colour-coded deviation representations and thus valid statements can be made about the usability of the respective component.

ZEISS METROTOM 1500 in the Q-Tech measurement laboratory

Our competence at a glance

Services

  • Detection of internal & external damage
  • Comprehensive mapping of internal discrepancies with the finest level of detail
  • Non-destructive measurement & analysis
  • High-resolution 3D or 2D display
  • Measurement of components up to a maximum measuring volume of ø 615 x 870 mm

Advantages

  • Detect defects inside
  • Customer-specific analyses possible through free viewer
  • No change of the test object 
  • Avoidance of cost-intensive production of component cuts
  • Non-contact analysis of transparent, flexible and soft components
  • Non-destructive detection of product and material defects

Our computer tomographs

ZEISS METROTOM 800 in the Q-Tech measurement lab

ZEISS METROTOM 800

  • X-ray tube: 130 kV
  • Measuring accuracy: MPE SD(TS): 2.9+L/100 µm
  • Resolution: 1536 x 1920 pixels (2K detector)
  • max. measuring volume: [mm] Ø 275 x 360
  • Accreditation: yes
  • Determination of dimensional and shape deviations of industrially manufactured products using computed tomography (CT);
  • Determination of 3D nominal/actual deviations of industrially manufactured products based on CAD data or reference data using computed tomography (CT) and corresponding evaluation software;
  • Carrying out analyses in the field of shrinkage testing on workpieces using computed tomography (CT);
ZEISS METROTOM 1500 in the Q-Tech measurement laboratory

ZEISS METROTOM 1500

  • X-ray tube: 225 kV
  • Measuring accuracy: MPE SD(TS): 4.5+L/50 µm
  • Resolution: 3072 x 3072 pixels (3K detector)
  • max. measuring volume: [mm] Ø 615 x 870
  • Accreditation: yes
  • Determination of dimensional and shape deviations of industrially manufactured products using computed tomography (CT);
  • Determination of 3D nominal/actual deviations of industrially manufactured products based on CAD data or reference data using computed tomography (CT) and corresponding evaluation software;
  • Carrying out analyses in the field of shrinkage testing on workpieces using computed tomography (CT);