Employees of Q-Tech Roding work in front of the ZEISS METROTOM 1500 computer tomograph

Technologies

CT
KMS
3D scan
"With our initial sample inspection report, we take the burden off your quality department, deliver robust results, and help get your project to the finish line."

To the point

ZEISS METROTOM 800 in the Q-Tech measurement lab

To keep your development times short, Q-Tech combines maximum precision with fast response and throughput times.

Our state-of-the-art measurement technology offers the unique opportunity to fully and non-destructively measure the quality of your initial sample, both internally and externally - even when assembled. Even complex geometries can be measured completely and with 100% accuracy.

The digitization and measurement of initial samples of any kind enables consistent product quality regardless of the manufacturing process. On request, we can visualize the high-precision measurement results in a clear and informative initial sample test report in accordance with standard specifications or taking your individual tolerance specifications into account.

Practical example

Would you like practical examples of the initial sample test report or do you have any questions? Then contact us, we will be happy to support you!

Request practical examples
Employees examine a component together in the measuring laboratory

Our competence at a glance

Services

  • Preparation of initial sample inspection reports according to VDA/PPAP or customer-specific specifications
  • Digitization of product data with very high measurement accuracy
  • Initial setup of the measurement program optionally in ZEISS CALYPSO, GOM Inspect Pro and VGSTUDIO MAX
  • Measurement also of assembled sample parts
  • Logging of all measured values
  • Visualization of the measurement results

Advantages

  • Non-destructive digitization and determination of all internal and external geometries 
  • Holistic consideration of components
  • Audit-proof archiving of your sample data
  • Creation of a digital reset pattern in STL data format

Our computer tomographs

ZEISS METROTOM 800 in the Q-Tech measurement lab

ZEISS METROTOM 800

  • X-ray tube: 130 kV
  • Measuring accuracy: MPE SD(TS): 2.9+L/100 µm
  • Resolution: 1536 x 1920 pixels (2K detector)
  • max. measuring volume: [mm] Ø 275 x 360
  • Accreditation: yes
  • Determination of dimensional and shape deviations of industrially manufactured products using computed tomography (CT);
  • Determination of 3D nominal/actual deviations of industrially manufactured products based on CAD data or reference data using computed tomography (CT) and corresponding evaluation software;
  • Carrying out analyses in the field of shrinkage testing on workpieces using computed tomography (CT);
ZEISS METROTOM 1500 in the Q-Tech measurement laboratory

ZEISS METROTOM 1500

  • X-ray tube: 225 kV
  • Measuring accuracy: MPE SD(TS): 4.5+L/50 µm
  • Resolution: 3072 x 3072 pixels (3K detector)
  • max. measuring volume: [mm] Ø 615 x 870
  • Accreditation: yes
  • Determination of dimensional and shape deviations of industrially manufactured products using computed tomography (CT);
  • Determination of 3D nominal/actual deviations of industrially manufactured products based on CAD data or reference data using computed tomography (CT) and corresponding evaluation software;
  • Carrying out analyses in the field of shrinkage testing on workpieces using computed tomography (CT);